Relaxation oscillations in a capacitive discharge chamber connected to a peripheral grounded chamber

被引:15
作者
Kim, Sungjin [1 ]
Zhou, Zhuwen
Lieberman, M. A.
Lichtenberg, A. J.
机构
[1] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA
[2] Guizhou Educ Coll, Dept Phys, Guiyang 550003, Guizhou, Peoples R China
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2384776
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have observed relaxation oscillations in an argon capacitive discharge connected to a peripheral grounded chamber through a slot with dielectric spacers. The oscillations, observed from time-varying optical emission of the main discharge chamber, show, for example, a high frequency (similar to 40 kHz) relaxation oscillation at 100 mTorr, with absorbed power near that for peripheral breakdown, and a low frequency (similar to 3 Hz) oscillation, at higher absorbed power. The high frequency oscillation is found to ignite a plasma in the slot, but usually not in the periphery. We interpret the high frequency oscillations using an electromagnetic model of the slot impedance, coupled to a circuit analysis of the system including the matching network. The model results are in general agreement with the experimental observations and indicate a variety of behaviors dependent on the matching conditions. (c) 2006 American Institute of Physics.
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页数:9
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