New Weighted Time Lag Method for the Analysis of Random Telegraph Signals

被引：49
|
作者：
Martin-Martinez, Javier [1 ]
Diaz, Javier [1 ]
Rodriguez, Rosana [1 ]
Nafria, Montserrat [1 ]
Aymerich, Xavier [1 ]
机构：
[1] Univ Autonoma Barcelona, Dept Elect Engn, Bellaterra 08193, Spain
来源：
IEEE ELECTRON DEVICE LETTERS | 2014年 / 35卷 / 04期
关键词：
Random telegraph signals; noise; CMOS; parameter extraction; characterization; NOISE; INSTABILITY;
D O I：
10.1109/LED.2014.2304673
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new method for the characterization of random telegraph signals (RTSs) is presented. The method, which is based on the time lag plot, is illustrated using Monte Carlo generated RTS traces and applied to identify the contribution of defects in multilevel RTS measured in a pMOS transistor. The results show that the new method provides a powerful and easily implementable technique to obtain the parameters of the defects responsible of multilevel RTS, even when the background noise is relevant.
引用
收藏
页码：479 / 481
页数：3
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