Study of Dielectric and Piezoelectric Properties of (1-x)PZT-xSFN Ceramics Prepared by Conventional Solid State Reaction Method

Modified-PZT ceramics with a formula (1-x)Pb(Zr-0.53 Tip(0.47))O-3-xSr(Fe-2/3, Nb-1/3)O-3 (doped with isovalent: Sr2+, acceptor: Fe3+ and Donor: Nb5+ ions) abbreviated as (1-x)PZT-xSFN binary system with varying x (x=0.02, 0.04, 0.06, 0.08 and 0.10) located near the morphotropic phase boundary (MPB) were prepared by a traditional process in a solid state. All the samples were sintered at a temperature of 1200 degrees C during 2 h. The phase structure, the dielectric and piezoelectric properties of the system were studied. In-phase analysis used X-ray diffraction (XRD) at room temperature indicated that the structure of phase of sintered PZT-SFN ceramics was formed in single-phase with a crystalline structure tetragonal. Raman spectroscopy confirms the presence of this tetragonal phase. The optimum electrical parameters are obtained at 0.94Pb(Zr0.53Ti0.47)O-3-0.06Sr(Fe-2/3, Nbi(1/3))O-3 system: k(p) = 66.10 %, d(31) = 145 pC/N, Q(m) = 473, tans delta = 1.11 %, and epsilon(r) = 1009.