Snapshot Imaging Mueller Matrix Instrument

被引:2
作者
Kudenov, Michael W. [1 ]
Mallik, Sushmit [1 ]
Escuti, Michael J. [1 ]
Hagen, Nathan [2 ]
Oka, Kazuhiko [3 ]
Dereniak, Eustace L. [4 ]
机构
[1] North Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USA
[2] Rebell Photon, Houston, TX USA
[3] Hokkaido Univ, Div Appl Phys, Sapporo, Hokkaido, Japan
[4] Univ Arizona, Coll Opt Sci, Tucson, AZ USA
来源
ELECTRO-OPTICAL REMOTE SENSING, PHOTONIC TECHNOLOGIES, AND APPLICATIONS VII; AND MILITARY APPLICATIONS IN HYPERSPECTRAL IMAGING AND HIGH SPATIAL RESOLUTION SENSING | 2013年 / 8897卷
基金
美国国家科学基金会;
关键词
Polarization; Mueller matrix polarimetry; polarization gratings; snapshot imaging; POLARIZATION GRATINGS; POLARIMETER; COMPACT; SPECTROPOLARIMETRY;
D O I
10.1117/12.2028546
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel way to measure the Mueller matrix image enables a sample's diattenuation, retardance, and depolarization to be measured within a single camera integration period. Since the Mueller matrix components are modulated onto coincident carrier frequencies, the described technique provides unique solutions to image registration problems for moving objects. In this paper, a snapshot imaging Mueller matrix polarimeter is theoretically described, and preliminary results shows it to be a viable approach for use in surface characterization of moving objects.
引用
收藏
页数:6
相关论文
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