ZnO crystals obtained by electrodeposition: Statistical analysis of most important process variables

被引:31
作者
Cembrero, Jesus [1 ]
Busquets-Mataix, David [1 ]
机构
[1] Univ Politecn Valencia, Dept Mech & Mat Engn, E-46071 Valencia, Spain
关键词
ZnO morphology; Electrodeposition; Two-level factorial design; ANOVA; ZINC-OXIDE FILMS; OPTICAL-PROPERTIES; THIN-FILMS; TEMPERATURE; SAPPHIRE;
D O I
10.1016/j.tsf.2008.10.069
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper a comparative study by means of a statistical analysis of the main process variables affecting ZnO crystal electrodeposition is presented. ZnO crystals were deposited on two different substrates, silicon wafer and indium tin oxide. The control variables were substrate types, electrolyte concentration, temperature, exposition time and current density. The morphologies of the different substrates were observed using scanning electron microscopy. The percentage of substrate area covered by ZnO deposit was calculated by computational image analysis. The design of the applied experiments was based on a two-level factorial analysis involving a series of 32 experiments and an analysis of variance. Statistical results reveal that variables exerting a significant influence on the area covered by ZnO deposit are electrolyte concentration, substrate type and time of deposition, together with a combined two-factor interaction between temperature and current density. However, morphology is also influenced by surface roughness of the substrates. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:2859 / 2864
页数:6
相关论文
共 22 条
[1]   Thermally stable, highly conductive, and transparent ZnO layers prepared in situ by chemical vapor deposition [J].
Ataev, BM ;
Bagamadova, AM ;
Mamedov, VV ;
Omaev, AK .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 65 (03) :159-163
[2]  
Bockris J.O.M., 1998, MODERN ELECTROCHEMIS, V2nd
[3]  
Box G. E. P., 1978, Statistics for experimenters. An introduction to design, data analysis and model building.
[4]  
Cembrero J, 2004, THIN SOLID FILMS, V451, P198, DOI [10.1016/j.tsf.2003.10.119, 10.1016/j.tsf.10.119]
[5]   Growth of ZnO single crystal thin films on c-plane (0 0 0 1) sapphire by plasma enhanced molecular beam epitaxy [J].
Chen, YF ;
Bagnall, DM ;
Zhu, ZQ ;
Sekiuchi, T ;
Park, KT ;
Hiraga, K ;
Yao, T ;
Koyama, S ;
Shen, MY ;
Goto, T .
JOURNAL OF CRYSTAL GROWTH, 1997, 181 (1-2) :165-169
[6]   Enhancement of surface morphology and optical properties of nanocolumnar ZnO films [J].
Donderis, V. ;
Hernandez-Fenollosa, M. A. ;
Damonte, L. C. ;
Mari, B. ;
Cembrero, J. .
SUPERLATTICES AND MICROSTRUCTURES, 2007, 42 (1-6) :461-467
[7]   Temperature effects on ZnO electrodeposition [J].
Goux, A ;
Pauporté, T ;
Chivot, J ;
Lincot, D .
ELECTROCHIMICA ACTA, 2005, 50 (11) :2239-2248
[8]  
Izaki M, 1996, APPL PHYS LETT, V68, P2439, DOI 10.1063/1.116160
[9]  
KNELL RI, 1996, PHYS LETT, V21, P270
[10]   The physics of snow crystals [J].
Libbrecht, KG .
REPORTS ON PROGRESS IN PHYSICS, 2005, 68 (04) :855-895