Absolute measurement of optical flat surface shape based on the conjugate differential method

被引:24
作者
Huang, Ya [1 ]
Ma, Jun [1 ]
Zhu, Rihong [1 ]
Yuan, Caojin [2 ]
Chen, Lei [1 ]
Cai, Huijuan [1 ]
Sun, Weiyuan [1 ]
机构
[1] Nanjing Univ Sci & Technol, Sch Elect Engn & Optoelect Technol, Nanjing 210094, Jiangsu, Peoples R China
[2] Nanjing Normal Univ, Dept Phys, Nanjing 210097, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
PHASE-SHIFTING INTERFEROMETER; ZERNIKE POLYNOMIALS; RECONSTRUCTION; METROLOGY; ROTATION; MIRROR;
D O I
10.1364/OE.23.029687
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this paper the conjugate differential method is proposed to measure the absolute surface shape of the flat mirror using a phase-shifting interferometer. The conjugate differential method is derived from the differential method, which extracts absolute phase differences by introducing the slight transverse shifts of the optic. It employs the measurement schemes making transverse shifts on the orthogonally bilateral symmetry positions. So the measurement procedures have been changed into four-step tests to get the phase difference map instead of three-step tests for the differential method. The precision of the slope approximation is enhanced by reducing couplings between multi-step tests, and the reliability of the measurements can be improved. Several differential wavefront reconstruction methods, such as Fourier transform, Zernike polynomial fitting and Hudgin model method, can be applied to reconstruct the absolute surface shape from the differencing phase maps in four different simulation environment. They were also used to reconstruct the absolute surface shape with the conjugate differential method in the experiment. Our method accords with the classical three-flat test better than the traditional differential method, where the deviation of RMS value between the conjugate differential method and the three-flat test is less than 0.3 nm. (C) 2015 Optical Society of America
引用
收藏
页码:29687 / 29697
页数:11
相关论文
共 22 条
[1]  
AI CY, 1992, P SOC PHOTO-OPT INS, V1776, P73
[2]  
[Anonymous], 1893, Nature, V48, P212
[3]   Absolute surface metrology with a phase-shifting interferometer for incommensurate transverse spatial shifts [J].
Bloemhof, E. E. .
APPLIED OPTICS, 2014, 53 (05) :792-797
[4]   Absolute surface metrology by differencing spatially shifted maps from a phase-shifting interferometer [J].
Bloemhof, E. E. .
OPTICS LETTERS, 2010, 35 (14) :2346-2348
[5]   Noniterative boundary-artifact-free wavefront reconstruction from its derivatives [J].
Bon, Pierre ;
Monneret, Serge ;
Wattellier, Benoit .
APPLIED OPTICS, 2012, 51 (23) :5698-5704
[6]   FIZEAU INTERFEROMETER FOR MEASURING FLATNESS OF OPTICAL SURFACES [J].
BUNNAGEL, R ;
OEHRING, HA ;
STEINER, K .
APPLIED OPTICS, 1968, 7 (02) :331-&
[7]   Comparison of wavefront reconstructions with Zernike polynomials and Fourier transforms [J].
Dai, Guang-ming .
JOURNAL OF REFRACTIVE SURGERY, 2006, 22 (09) :943-948
[8]   Test optics error removal [J].
Evans, CJ ;
Kestner, RN .
APPLIED OPTICS, 1996, 35 (07) :1015-1021
[9]   Absolute interferometric testing based on reconstruction of rotational shear [J].
Freischlad, KR .
APPLIED OPTICS, 2001, 40 (10) :1637-1648
[10]   ABSOLUTE CALIBRATION OF AN OPTICAL FLAT [J].
FRITZ, BS .
OPTICAL ENGINEERING, 1984, 23 (04) :379-383