Polytype transformation and structural characteristics of 3C-SiC on 6H-SiC substrates

被引:15
作者
Vasiliauskas, R. [1 ]
Marinova, M. [2 ]
Syvajarvi, M. [1 ]
Polychroniadis, E. K. [2 ]
Yakimova, R. [1 ]
机构
[1] Linkoping Univ, Dept Phys Chem & Biol, S-58183 Linkoping, Sweden
[2] Aristotle Univ Thessaloniki, Dept Phys, Thessaloniki 54124, Greece
基金
瑞典研究理事会;
关键词
Nucleation; Characterization; Crystal structure; Vapor phase cpitaxy; Cubic silicon carbide; CUBIC SILICON-CARBIDE; BETA-SIC FILMS; TWIN BOUNDARY; GRAIN-BOUNDARIES; ATOMIC-STRUCTURE; GROWTH; DEFECTS; LAYERS; CVD; INTERFACE;
D O I
10.1016/j.jcrysgro.2014.03.021
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The 3C-SiC (111) was grown on on axis 6H-SiC substrates in a Lemperature interval ranging from 1675 degrees C where 3C-SiC nucleated, to 1825 degrees C where coverage of the substrate by 3C-SiC was nearly 100%. The 6H- to 3C-SiC transformation was not abrupt and two different transitions could be observed. The first one occurs before or during 3C-SiC nucleation and consists of 6H-, 3C-, 15R-SiC and other mixed stacking sequences. The second one appears due to 6H-SiC and 3C-SiC competition during the growth and results in needle-like interface. A proposed model elucidates connection between four-fold twins nucleating at the 6H-/3C-SiC interface and the formation of depressions at the surface of the 3C-SiC layer. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:109 / 115
页数:7
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