Assembly and characterization of optical MEMS (Micro-Electro-Mechanical Systems)

被引:0
作者
Khalil, D [1 ]
Morshed, AH [1 ]
机构
[1] Ain Shams Univ, Fac Elect Engn, Cairo, Egypt
来源
THIRD WORKSHOP ON PHOTONICS AND ITS APPLICATION AT EGYPTIAN ENGINEERING FACULTIES & INSTITUTES | 2002年
关键词
D O I
10.1109/PAIA.2002.995083
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this work we present a locally developed MEMS-based technology for the assembly and characterization of optical MEMS components. For the assembly purpose, the processes required for the Si and glass micromachineing (oxidation, photolithography and wet etching) are developed in the Laser lab at the faculty of Engineering, Ain Shams University. For the characterization purpose, an automated set-up for the spot size and mis-alignement losses measurements are developed. Both tasks have been fulfilled with a high scientific and engineering level through a B. Sc. project.
引用
收藏
页码:111 / 116
页数:6
相关论文
共 50 条
  • [21] Optical spatial heterodyned interferometry for inspection of micro-electro-mechanical systems
    Tobin, Kenneth W.
    Bingham, Philip R.
    Price, Jeffery R.
    EIGHT INTERNATIONAL CONFERENCE ON QUALITY CONTROL BY ARTIFICIAL VISION, 2007, 6356
  • [22] Dynamic analysis of micro-electro-mechanical systems
    Shi, F
    Ramesh, P
    Mukherjee, S
    INTERNATIONAL JOURNAL FOR NUMERICAL METHODS IN ENGINEERING, 1996, 39 (24) : 4119 - 4139
  • [23] Thermo-viscous acoustic modeling of perforated micro-electro-mechanical systems (MEMS)
    Naderyan, Vahid
    Raspet, Richard
    Hickey, Craig
    JOURNAL OF THE ACOUSTICAL SOCIETY OF AMERICA, 2020, 148 (04) : 2376 - 2385
  • [24] Micro-Electro-Mechanical Systems in Light Stabilization
    Gilewski, Marian
    SENSORS, 2023, 23 (06)
  • [25] Design Automation for Micro-Electro-Mechanical Systems
    Kriebel, David
    Schmidt, Henry
    Schiebold, Michael
    Freitag, Markus
    Arnold, Benjamin
    Naumann, Michael
    Mehner, Jan. E.
    CAS 2018 PROCEEDINGS: 2018 INTERNATIONAL SEMICONDUCTOR CONFERENCE, 2018, : 43 - 50
  • [26] A novel approach for determining pull-in voltages in micro-electro-mechanical systems (MEMS)
    Long, DS
    Shannon, MA
    Aluru, NR
    2000 INTERNATIONAL CONFERENCE ON MODELING AND SIMULATION OF MICROSYSTEMS, TECHNICAL PROCEEDINGS, 2000, : 481 - 484
  • [27] Residual stresses in micro-electro-mechanical systems
    Qian, Jin
    Liu, Cheng
    Zhang, Dacheng
    Zhao, Yapu
    Journal of Mechanical Strength, 2001, 23 (04) : 393 - 401
  • [28] Reduced-Order Modeling of Parametrically Excited Micro-Electro-Mechanical Systems (MEMS)
    Redkar, Sangram
    ADVANCES IN MECHANICAL ENGINEERING, 2010,
  • [29] Mechanical properties and scaling effects in micro-electro-mechanical systems
    Mei, Tao
    Kong, Deyi
    Zhang, Peiqiang
    Wu, Xiaoping
    2001, Journal of Mechanical Strength (23)
  • [30] Quantum control spectroscopy (QCS) with a micro-electro-mechanical system (MEMS)
    Buckup, T.
    Moehring, J.
    Motzkus, M.
    MEMS ADAPTIVE OPTICS III, 2009, 7209