Atomic Perspectives Rapid Multielement Nanoparticle Analysis Using Single-Particle ICP-MS/MS

被引：0

作者：

Jones, Craig ^{[1
]}

Soffey, Emmett ^{[2
,3
]}

Kelinske, Mark ^{[4
,5
]}

机构：

[1] Agilent, Santa Clara, CA USA

[2] Agilent, Seattle, WA 98125 USA

[3] Brookhaven Natl Labs, Acid Rain Adirondack Mt Northern New York, Upton, NY 11973 USA

[4] Agilent, Elm Mott, TX USA

[5] Southern Res Inst, Birmingham, AL USA

来源：

SPECTROSCOPY | 2019年 / 34卷 / 05期

关键词：

D O I：

暂无

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

There are well recognized difficulties in measuring nanoparticles (NPs) accurately by conventional single-quadrupole inductively coupled plasma mass spectrometry (ICP-MS), because many natural and engineered NPs are based on elements that are challenging to measure at trace level by ICP-MS, such as iron, titanium, and silicon. This month's "Atomic Perspectives" column discusses how complex isobaric and polyatomic spectral interferences can be mitigated using triple-quadrupole ICP-MS (ICP-MS/MS) utilizing a collision-reaction cell (CRC), allowing for the multielement characterization and detection of smaller nanoparticle sizes.

引用

页码：10 / 20

页数：11

共 5 条

[1] Characterization of SiO2 nanoparticles by single particle-inductively coupled plasma-tandem mass spectrometry (SP-ICP-MS/MS) [J].