Dynamics at the air-water interface revealed by evanescent wave light scattering

被引：8

作者：

Stocco, A. ^{[1
]}

Tauer, K. ^{[1
]}

Pispas, S. ^{[2
]}

Sigel, R. ^{[3
]}

机构：

[1] Max Planck Inst Colloids & Interfaces, D-14476 Golm, Germany

[2] Natl Hellen Res Fdn, Inst Theoret & Phys Chem, GR-11635 Athens, Greece

[3] Univ Fribourg, Adolphe Merkle Inst, CH-1700 Fribourg, Switzerland

来源：

EUROPEAN PHYSICAL JOURNAL E | 2009年 / 29卷 / 01期

关键词：

X-RAY; REFLECTIVITY MEASUREMENTS; BLOCK-COPOLYMERS; LIQUID SURFACES; FLUCTUATIONS; BEAM;

D O I：

10.1140/epje/i2009-10455-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A new tool to study surface phenomena by evanescent wave light scattering is employed for an investigation of an aqueous surface through the water phase. When the angle of incidence passes the critical angle of total internal reflection, a high and narrow scattering peak is observed. It is discussed as an enhancement of scattering at critical angle illumination. Peak width and height are affected by the interfacial profile and the focusing of the beam. In addition, the propagation of capillary waves was studied at the surface of pure water and in the presence of latex particles and amphiphilic diblock copolymers. The range of the scattering vectors where propagating surface waves were detected is by far wider than standard surface quasi-elastic light scattering (SQELS) and comparable with those of X-ray photon correlation spectroscopy (XPCS).

引用

页码：95 / 105

页数：11

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