New techniques for deterministic test pattern generation

被引:40
作者
Hamzaoglu, I [1 ]
Patel, JH [1 ]
机构
[1] Univ Illinois, Ctr Reliable & High Performance Comp, Urbana, IL 61801 USA
来源
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 1999年 / 15卷 / 1-2期
关键词
automatic test generation; stuck-at fault; redundancy; scan design; logic implications; Boolean satisfiability;
D O I
10.1023/A:1008355411566
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents new techniques for speeding up deterministic test pattern generation for VLSI circuits. These techniques improve the PODEM algorithm by reducing number of backtracks with a low computational cost. This is achieved by finding more necessary signal line assignments, by detecting conflicts earlier, and by avoiding unnecessary work during test generation. We have incorporated these techniques into an advanced ATPG system for combinational circuits, called ATOM. The performance results for the ISCAS85 and full scan version of the ISCAS89 benchmark circuits demonstrated the effectiveness of these techniques on the test generation performance. ATOM detected all the testable faults and proved all the redundant faults to be redundant with a small number of backtracks in a short amount of time.
引用
收藏
页码:63 / 73
页数:11
相关论文
共 24 条
[1]   SMART AND FAST - TEST-GENERATION FOR VLSI SCAN-DESIGN CIRCUITS [J].
ABRAMOVICI, M ;
KULIKOWSKI, JJ ;
MENON, PR ;
MILLER, DT .
IEEE DESIGN & TEST OF COMPUTERS, 1986, 3 (04) :43-54
[2]  
[Anonymous], 1989, SYSTEMS ISCAS
[3]  
[Anonymous], P 24 DES AUT C
[4]  
BRGLEZ F, 1985, P INT S CIRC SYST JU
[5]   A TRANSITIVE CLOSURE ALGORITHM FOR TEST-GENERATION [J].
CHAKRADHAR, ST ;
AGRAWAL, VD ;
ROTHWEILER, SG .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1993, 12 (07) :1015-1028
[6]  
CHANDRA SJ, 1989, IEEE T COMPUTER JAN, P93
[7]  
CHENG KT, 1996, ACM T DESIGN AUT OCT, P405
[8]  
FUJIWARA H, 1983, IEEE T COMPUT, V32, P1137, DOI 10.1109/TC.1983.1676174
[9]  
FUJIWARA H, 1982, IEEE T COMPUT, V31, P555, DOI 10.1109/TC.1982.1676041
[10]  
GOEL P, 1981, IEEE T COMPUTERS MAR, P21