X-ray section images of dislocations and dislocation barriers in Si

被引:5
作者
Novikov, S. [1 ]
Fodchuk, I. [1 ]
Fedortsov, D. [1 ]
Struk, A. [1 ]
机构
[1] Chernivtsi Natl Univ, Chernivtsi 58012, Russia
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2009年 / 206卷 / 08期
关键词
D O I
10.1002/pssa.200881592
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
By means of numerical solution of the Takagi equations, modeling of X-ray topographic images of deformation fields of the Lomer-Cottrell dislocation loops and dislocation barriers is made depending on their spatial location for the thin and thick crystals. Diffraction images created by dislocation loops and barriers of different size and spatial location are complicated and versatile in their thin structure. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:1820 / 1824
页数:5
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