Application of Dynamic Impedance Spectroscopy to Scanning Probe Microscopy

被引：0

作者：

Tobiszewski, Mateusz Tomasz ^{[1
]}

Arutunow, Anna ^{[1
]}

Darowicki, Kazimierz ^{[1
]}

机构：

[1] Gdansk Univ Technol, Dept Electrochem Corros & Mat Engn, PL-80233 Gdansk, Poland

来源：

MICROSCOPY AND MICROANALYSIS | 2014年 / 20卷 / 02期

关键词：

AFM; SPM; DEIS; nanoimpedance; impedance; nanocontact; ATOMIC-FORCE MICROSCOPY; CONTACT MODE; NANOSCALE; CORROSION; SPECTRA; AFM;

D O I：

10.1017/S1431927613013974

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Dynamic impedance spectroscopy, designed for measuring nonstationary systems, was used in combination with scanning probe microscopy. Using this approach, impedance mapping could be carried-out simultaneously with topography scanning. Therefore, correlation of electrical properties with particular phases of an examined sample was possible. The sample used in this study was spheroidal graphite cast iron with clearly defined phases having significantly different properties. Additionally, impedance-force curves were made at graphite precipitation and ferrite matrix to illustrate the relation between impedance and the force applied to a probe.

引用

页码：582 / 585

页数：4

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