A nitrogen-hyperdoped silicon material formed by femtosecond laser irradiation

被引:63
作者
Dong, Xiao [1 ]
Li, Ning [2 ]
Zhu, Zhen [1 ]
Shao, Hezhu [1 ]
Rong, Ximing [1 ]
Liang, Cong [2 ]
Sun, Haibin [2 ]
Feng, Guojin [3 ]
Zhao, Li [2 ]
Zhuang, Jun [1 ]
机构
[1] Fudan Univ, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Dept Opt Sci & Engn, Shanghai 200433, Peoples R China
[2] Fudan Univ, Dept Phys, State Key Lab Surface Phys, Shanghai 200433, Peoples R China
[3] Natl Inst Metrol, Spectrophotometry Lab, Beijing 100013, Peoples R China
关键词
OXYGEN PRECIPITATION; NF3; DISSOCIATION; DISCHARGES; MECHANISMS; PLASMAS;
D O I
10.1063/1.4868017
中图分类号
O59 [应用物理学];
学科分类号
摘要
A supersaturation of nitrogen atoms is found in the surface layer of microstructured silicon after femtosecond (fs) laser irradiation in NF3. The average nitrogen concentration in the uppermost 50 nm is about 0.5 +/- 0.2 at.%, several orders of magnitude higher than the solid solubility of nitrogen atoms in silicon. The nitrogen-hyperdoped silicon shows high crystallinity in the doped layer, which is due to the repairing effect of nitrogen on defects in silicon lattices. Nitrogen atoms and vacancies can be combined into thermal stable complexes after fs laser irradiation, which makes the nitrogen-hyperdoped silicon exhibit good thermal stability of optical properties. (C) 2014 AIP Publishing LLC.
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页数:4
相关论文
共 24 条
[1]   Nitrogen diffusion and interaction with dislocations in single-crystal silicon [J].
Alpass, C. R. ;
Murphy, J. D. ;
Falster, R. J. ;
Wilshaw, P. R. .
JOURNAL OF APPLIED PHYSICS, 2009, 105 (01)
[2]   Lifetime recovery in ultrahighly titanium-doped silicon for the implementation of an intermediate band material [J].
Antolin, E. ;
Marti, A. ;
Olea, J. ;
Pastor, D. ;
Gonzalez-Diaz, G. ;
Martil, I. ;
Luque, A. .
APPLIED PHYSICS LETTERS, 2009, 94 (04)
[3]   CHEMICAL ETCHING OF SILICON BY CO2-LASER-INDUCED DISSOCIATION OF NF3 [J].
BRANNON, JH .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1988, 46 (01) :39-50
[4]   Ultrafast lasers in materials research [J].
Cahill, David G. ;
Yalisove, Steve M. .
MRS BULLETIN, 2006, 31 (08) :594-600
[5]   Visible and near-infrared responsivity of femtosecond-laser microstructured silicon photodiodes [J].
Carey, JE ;
Crouch, CH ;
Shen, MY ;
Mazur, E .
OPTICS LETTERS, 2005, 30 (14) :1773-1775
[6]   Comparison of structure and properties of femtosecond and nanosecond laser-structured silicon [J].
Crouch, CH ;
Carey, JE ;
Warrender, JM ;
Aziz, MJ ;
Mazur, E ;
Génin, FY .
APPLIED PHYSICS LETTERS, 2004, 84 (11) :1850-1852
[7]   Strong Mid-Infrared Absorption and High Crystallinity of Microstructured Silicon Formed by Femtosecond Laser Irradiation in NF3 Atmosphere [J].
Dong, Xiao ;
Li, Ning ;
Liang, Cong ;
Sun, Haibin ;
Feng, Guojin ;
Zhu, Zhen ;
Shao, Hezhu ;
Rong, Ximing ;
Zhao, Li ;
Zhuang, Jun .
APPLIED PHYSICS EXPRESS, 2013, 6 (08)
[8]   Insulator-to-Metal Transition in Selenium-Hyperdoped Silicon: Observation and Origin [J].
Ertekin, Elif ;
Winkler, Mark T. ;
Recht, Daniel ;
Said, Aurore J. ;
Aziz, Michael J. ;
Buonassisi, Tonio ;
Grossman, Jeffrey C. .
PHYSICAL REVIEW LETTERS, 2012, 108 (02)
[9]   MECHANISMS OF SILICON ETCHING IN FLUORINE-CONTAINING AND CHLORINE-CONTAINING PLASMAS [J].
FLAMM, DL .
PURE AND APPLIED CHEMISTRY, 1990, 62 (09) :1709-1720
[10]   Vibrational modes and electronic properties of nitrogen defects in silicon -: art. no. 045206 [J].
Goss, JP ;
Hahn, I ;
Jones, R ;
Briddon, PR ;
Öberg, S .
PHYSICAL REVIEW B, 2003, 67 (04)