Sol-gel-derived thin-film stacks with high radiation stability

被引：6

作者：

Dahlby, Michael R. ^{[1
,2
]}

Barhoum, Moussa ^{[1
]}

Bartl, Michael H. ^{[1
,2
]}

机构：

[1] Univ Utah, Dept Chem, Salt Lake City, UT 84112 USA

[2] Univ Utah, MRSEC, Salt Lake City, UT 84112 USA

来源：

THIN SOLID FILMS | 2014年 / 562卷

基金：

美国国家科学基金会;

关键词：

Sol-gel chemistry; Bragg stacks; Thin films; Photonic materials; Radiation stability; FABRICATION; STRESS; COATINGS; SURFACE; DESIGN; DAMAGE;

D O I：

10.1016/j.tsf.2014.03.053

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Crack-free thin-film stacks of silica and titania layers were prepared by a sol-gel dip-coating process involving flash-heating and shock-cooling steps. The final Bragg stacks were thermally annealed at different temperatures and their properties were investigated. While annealing increased the intra-layer properties (layer densification, increased crystallinity), it weakened inter-layer strength, leading to cracking and delamination under high-power laser irradiation. In contrast, stacks that were flash-heated only showed excellent radiation stability. (C) 2014 Elsevier B.V. All rights reserved.

引用

页码：435 / 439

页数：5

共 18 条

[1] Rapid Sol-Gel Fabrication of High-Quality Thin-Film Stacks on Planar and Curved Substrates [J].

Barhoum, Moussa ;

Morrill, Jacob M. ;

Riassetto, David ;

Bartl, Michael H. .

CHEMISTRY OF MATERIALS, 2011, 23 (23) :5177-5184

[2] 3-D molecular assembly of function in titania-based composite material systems [J].

Bartl, MH ;

Boettcher, SW ;

Frindell, KL ;

Stucky, GD .

ACCOUNTS OF CHEMICAL RESEARCH, 2005, 38 (04) :263-271

[3] DIELECTRIC MIRROR DAMAGE BY LASER RADIATION OVER A RANGE OF PULSE DURATIONS AND BEAM RADII [J].

BLISS, ES ;

MILAM, D ;

BRADBURY, RA .

APPLIED OPTICS, 1973, 12 (04) :677-689

[4] Densification and microstructural evolution of TiO2 films prepared by sol-gel processing [J].

Bockmeyer, Matthias ;

Loebmann, Peer .

CHEMISTRY OF MATERIALS, 2006, 18 (18) :4478-4485

[5]

Brinker C. J., 2013, SOL GEL SCI PHYS CHE, DOI [DOI 10.1016/B978-0-08-057103-4.50001-5, 10.1016/C2009-0-22386-5]

[6] SURFACE AND INTERFACE STRESS EFFECTS IN THIN-FILMS [J].

CAMMARATA, RC .

PROGRESS IN SURFACE SCIENCE, 1994, 46 (01) :1-38

[7] Surface stress model for intrinsic stresses in thin films [J].

Cammarata, RC ;

Trimble, TM ;

Srolovitz, DJ .

JOURNAL OF MATERIALS RESEARCH, 2000, 15 (11) :2468-2474

[8] Review of the anatase to rutile phase transformation [J].

Hanaor, Dorian A. H. ;

Sorrell, Charles C. .

JOURNAL OF MATERIALS SCIENCE, 2011, 46 (04) :855-874

[9] Mesoporous thin films: Properties and applications [J].

Innocenzi, Plinio ;

Costacurta, SteFano ;

Kidchob, Tongjt ;

Malfatti, Luca ;

Falcaro, Paolo ;

Soler-Illia, Galo .

SOL-GEL METHODS FOR MATERIALS PROCESSING: FOCUSING ON MATERIALS FOR POLLUTION CONTROL, WATER PURIFICATION, AND SOIL REMEDIATION, 2008, :105-+

[10] Low-temperature, solution processing of TiO2 thin films and fabrication of multilayer dielectric optical elements [J].

Jiang, Kai ;

Zakutayev, Andriy ;

Stowers, Jason ;

Anderson, Michael D. ;

Tate, Janet ;

McIntyre, David H. ;

Johnson, David C. ;

Keszler, Douglas A. .

SOLID STATE SCIENCES, 2009, 11 (09) :1692-1699

← 1 2 →