X-ray diffraction, Raman, and photoacoustic studies of ZnTe nanocrystals

被引:34
作者
Ersching, K. [1 ]
Campos, C. E. M. [1 ]
de Lima, J. C. [1 ]
Grandi, T. A. [1 ]
Souza, S. M. [2 ]
da Silva, D. L. [2 ]
Pizani, P. S. [3 ]
机构
[1] Univ Fed Santa Catarina, Dept Fis, BR-88040900 Florianopolis, SC, Brazil
[2] Univ Fed Santa Catarina, Dept Engn Mecan, BR-88040900 Florianopolis, SC, Brazil
[3] Univ Fed Sao Carlos, Dept Fis, BR-13565905 Sao Carlos, SP, Brazil
关键词
THERMAL-DIFFUSIVITY; THIN-FILMS; SCATTERING; PHONONS; MODEL;
D O I
10.1063/1.3155887
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nanocrystalline ZnTe was prepared by mechanical alloying. X-ray diffraction (XRD), energy dispersive spectroscopy, Raman spectroscopy, and photoacoustic absorption spectroscopy techniques were used to study the structural, chemical, optical, and thermal properties of the as-milled powder. An annealing of the mechanical alloyed sample at 590 degrees C for 6 h was done to investigate the optical properties in a defect-free sample (close to bulk form). The main crystalline phase formed was the zinc-blende ZnTe, but residual trigonal tellurium and hexagonal ZnO phases were also observed for both as-milled and annealed samples. The structural parameters, phase fractions, average crystallite sizes, and microstrains of all crystalline phases were obtained from Rietveld analyses of the X-ray patterns. Raman results corroborate the XRD results, showing the longitudinal optical phonons of ZnTe (even at third order) and those modes of trigonal Te. Nonradiative surface recombination and thermal bending heat transfer mechanisms were proposed from photoacoustic analysis. An increase in effective thermal diffusivity coefficient was observed after annealing and the carrier diffusion coefficient, the surface recombination velocity, and the recombination time parameters remained the same. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3155887]
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页数:6
相关论文
共 31 条
[1]  
ALEKSIEJUNAS R, 2003, P 10 EUR WORKS UNPUB
[2]  
[Anonymous], 1987, GEN STRUCTURE ANAL S
[3]   Optical and structural properties of two-sourced evaporated ZnTe thin films [J].
Aqili, AKS ;
Ali, Z ;
Maqsood, A .
APPLIED SURFACE SCIENCE, 2000, 167 (1-2) :1-11
[4]   Study of ZnTe thin films deposited by r.f. sputtering [J].
Bellakhder, H ;
Outzourhit, A ;
Ameziane, EL .
THIN SOLID FILMS, 2001, 382 (1-2) :30-33
[5]   Synthesis of nanocrystalline zinc blende ZnTe by mechanical alloying [J].
Campos, C. E. M. ;
de Lima, J. C. ;
Grandi, T. A. ;
Hoehn, H. .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 2008, 354 (29) :3503-3506
[6]  
Cullity B.D., 1978, ELEMENTS XRAY DIFFRA, V2nd, P285
[7]   High-pressure Raman spectroscopy study of wurtzite ZnO [J].
Decremps, F ;
Pellicer-Porres, J ;
Saitta, AM ;
Chervin, JC ;
Polian, A .
PHYSICAL REVIEW B, 2002, 65 (09) :921011-921014
[8]   PHOTOACOUSTIC CHARACTERIZATION OF CHALCOGENIDE GLASSES - THERMAL-DIFFUSIVITY OF GEXTE1-X [J].
DELIMA, JC ;
CELLA, N ;
MIRANDA, LCM ;
AN, CC ;
FRANZAN, AH ;
LEITE, NF .
PHYSICAL REVIEW B, 1992, 46 (21) :14186-14189
[9]   Solvothermal synthesis of single crystalline ZnTe nanorod bundles in a mixed solvent of ethylenediamine and hydrazine hydrate [J].
Du, Jin ;
Xu, Liqiang ;
Zou, Guifu ;
Chai, Lanlan ;
Qian, Yitai .
JOURNAL OF CRYSTAL GROWTH, 2006, 291 (01) :183-186
[10]  
*E S MICR INC, 2002, TAPP VERS 2 2