Magnetic X-ray measurements using the elliptical multipole wiggler

被引：4

作者：

Montano, PA ^{[1
]}

Li, YW ^{[1
]}

Ruett, U ^{[1
]}

Beno, MA ^{[1
]}

Jennings, G ^{[1
]}

Kimball, CW ^{[1
]}

机构：

[1] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

来源：

X-RAY OPTICS DESIGN, PERFORMANCE, AND APPLICATIONS | 1999年 / 3773卷

关键词：

Compton scattering; polarization; insertion device; elliptical multipole wiggler; x-rays; synchrotron; flux; magnetic; helicity;

D O I：

10.1117/12.370099

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The EMW at the BESSRC beam lines at the APS provides high photon flux at high energies with the capability of producing circular polarization on axis. We observe a high degree of circularly polarized x-rays at such energies. The polarization and frequency tunability of the elliptical multipole wiggler (EMW) is an ideal source for many magnetic measurements from X-ray Magnetic Circular Dichroism (XMCD) to Compton scattering experiments. We performed Compton scattering measurements to determine the polarization and photon flux at the sample as a function of the deflection parameters K-y and K-x. We used for our measurements a Si (220) Laue monochromator providing simultaneous photon energies at 50 keV, 100 keV and 150 keV. Magnetic Compton Profiles were determined by either switching the magnet polarity or the photon helicity. The results obtained using Fe (110) single crystals were very similar.

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收藏

页码：262 / 274

页数：13

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