Temperature-Enhanced Solvent Vapor Annealing of a C3 Symmetric Hexa-peri-Hexabenzocoronene: Controlling the Self-Assembly from Nano- to Macroscale

被引：54

作者：

Treossi, Emanuele ^{[1
]}

Liscio, Andrea ^{[1
]}

Feng, Xinliang ^{[2
]}

Palermo, Vincenzo ^{[1
]}

Muellen, Klaus ^{[2
]}

Samori, Paolo ^{[3
]}

机构：

[1] CNR, Ist Sintesi Organ & Fotoreattivita, I-40129 Bologna, Italy

[2] Max Planck Inst Polymer Res, D-55124 Mainz, Germany

[3] Univ Louis Pasteur 8, CNRS, ISIS 7006, Nanochem Lab, F-67083 Strasbourg, France

来源：

SMALL | 2009年 / 5卷 / 01期

关键词：

annealing; nanocrystals; scanning probe microscopy; self-assembly; thin layers; SINGLE POLYMER-CHAINS; THIN-FILM; FORCE MICROSCOPY; CHARGE-TRANSPORT; MOLECULAR WIRES; X-RAY; SURFACE; TRANSISTORS; MOBILITY; SEMICONDUCTOR;

D O I：

10.1002/smll.200801002

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Temperature-enhanced solvent vapor annealing (TESVA) is used to self assemble functionalized polycyclic aromatic hydrocarbon molecules into ordered macroscopic layers and crystals on solid surfaces. A novel C-3 symmetric hexa-peri-hexabenzocoronene functionalized with alternating hydrophilic and hydrophobic side chains is used as a model system since its multivalent character can be expected to offer unique self-assembly properties and behavior in different solvents. TESVA promotes the molecule's long-range mobility, as proven by their diffusion on a Si/SiOx surface on a scale of hundreds of micrometers. This leads to self-assembly into large, ordered crystals featuring an edge-on columnar type of arrangement, which differs from the morphologies obtained using conventional solution-processing methods such as spin-coating or drop-casting. The temperature modulation in the TESVA makes it possible to achieve an additional control over the role of hydrodynamic forces in the self-assembly at surfaces, leading to a macroscopic self-healing within the adsorbed film notably improved as compared to conventional solvent vapor annealing. This surface re-organization can be monitored in real time by optical and atomic force microscopy.

引用

页码：112 / 119

页数：8

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