Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors

被引：0

作者：

Gourary, MM ^{[1
]}

Rusakov, SG ^{[1
]}

Ulyanov, SL ^{[1
]}

Zharov, MM ^{[1
]}

Mulvaney, BJ ^{[1
]}

机构：

[1] Russian Acad Sci, IPPM, Moscow, Russia

来源：

SECOND CONFERENCE ON PHOTONICS FOR TRANSPORTATION | 2002年 / 4761卷

关键词：

CMOS imager circuits; noise simulation; time-varying models; transient noise analysis;

D O I：

10.1117/12.463477

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper presents an approach for noise characterization of read-out circuits for CMOS image sensors in frames of transient noise analysis. It provides computation of the complete probabilistic characterization of such circuits. The method is efficient because no time-consuming convolution-like procedures are used. The flicker noise is naturally taken into account without additional computational efforts.

引用

页码：206 / 214

页数：9

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