Time-domain non-Monte-Carlo method for noise simulation in CMOS imager sensors

被引：0
|
作者：
Gourary, MM [1 ]
Rusakov, SG [1 ]
Ulyanov, SL [1 ]
Zharov, MM [1 ]
Mulvaney, BJ [1 ]
机构：
[1] Russian Acad Sci, IPPM, Moscow, Russia
来源：
SECOND CONFERENCE ON PHOTONICS FOR TRANSPORTATION | 2002年 / 4761卷
关键词：
CMOS imager circuits; noise simulation; time-varying models; transient noise analysis;
D O I：
10.1117/12.463477
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This paper presents an approach for noise characterization of read-out circuits for CMOS image sensors in frames of transient noise analysis. It provides computation of the complete probabilistic characterization of such circuits. The method is efficient because no time-consuming convolution-like procedures are used. The flicker noise is naturally taken into account without additional computational efforts.
引用
收藏
页码：206 / 214
页数：9
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