Lithium diffusion coefficient in LiMn2O4 thin films measured by secondary ion mass spectrometry with ion-exchange method

被引：43

作者：

Kuwata, Naoaki ^{[1
]}

Nakane, Masakatsu ^{[1
]}

Miyazaki, Takamichi ^{[2
]}

Mitsuishi, Kazutaka ^{[3
]}

Kawamura, Junichi ^{[1
]}

机构：

[1] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Katahira 2-1-1, Sendai, Miyagi 9808577, Japan

[2] Tohoku Univ, Sch Engn, Aoba Ku, 6-6-11 Aramaki Aza Aoba, Sendai, Miyagi 9808579, Japan

[3] Natl Inst Mat Sci, 1-2-1 Sengen, Tsukuba, Ibaraki 3050047, Japan

来源：

SOLID STATE IONICS | 2018年 / 320卷

关键词：

SIMS; Tracer diffusion coefficient; Mixed conductor; Thin film; Lithium-ion battery; PULSED-LASER DEPOSITION; ELECTROCHEMICAL PROPERTIES; BATTERIES; SPECTROSCOPY; ELECTRODES;

D O I：

10.1016/j.ssi.2018.03.012

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

In this study, the lithium tracer diffusion coefficient (Ai') in spinel-type LiMn2O4 thin films is measured by secondary ion mass spectroscopy (SIMS) in the temperature range from 200 to 550 degrees C. An ion-exchange method is employed to prepare diffusion couples consisting of the stable isotopes Li-6 and Li-7. The isotope profiles were measured by SIMS analysis to determine D-Li* in the LiMn2O4 films. The Du* value was 1.4 x 10(-10) cm(2)/s at 300 degrees C and the activation energy was 0.52 eV, which is consistent with that of bulk LiMn2O4. The extrapolated value of D-Li(*) at 25 degrees C was on the order of 10(-14) cm(2)/s, which is smaller than the chemical diffusion coefficient of LixMn(2)O(4) measured by electrochemical methods. The temperature dependence of Du* can be explained by the vacancy diffusion model, in which the extrinsic and intrinsic regions of diffusion exist in the low- and high temperature regions, respectively.

引用

页码：266 / 271

页数：6

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