An active millimeter load-pull measurement system using two six-port reflectometers operating in the W-frequency band

被引:6
作者
Abou Chahine, S [2 ]
Huyart, B
Bergeault, E
Jallet, LP
机构
[1] Ecole Natl Super Telecommun Bretagne, Paris, France
[2] Beirut Arab Univ, Beirut, Lebanon
关键词
load-pull; millimeter; nonlinear; power; reflectometers; six-port; transistor; W-band;
D O I
10.1109/TIM.2002.1017708
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An active load-pull measurement system using two six-port reflectometers operating in the W-frequency band is demonstrated. Ninety loads over the whole Smith chart have been synthesized and measured by both reflectometers. The maximum deviation between both measurement data is 0.02 for the magnitude and 3degrees for the phase of the reflection coefficient of the 90 loads. The constant power gain circles of a PHEMT operating at 89 GHz are shown and compared with those calculated from its S-ij scattering parameters. The deviation between the radii of circles is less than 0.03.
引用
收藏
页码:408 / 412
页数:5
相关论文
共 10 条
[1]  
[Anonymous], 1976 IEEE MTT S INT, DOI DOI 10.1109/MWSYM.1976.1123701
[2]  
BERGEAULT E, 1991, IEEE INSTRUM MEAS, V40
[3]  
BLACHE F, 1995, IEEE MTT-S, P1037, DOI 10.1109/MWSYM.1995.406149
[4]   A 6-PORT REFLECTOMETER CALIBRATION USING SCHOTTKY DIODES OPERATING IN AC DETECTION MODE [J].
CHAHINE, SA ;
HUYART, B ;
BERGEAULT, E ;
JALLET, L .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1993, 42 (02) :505-510
[5]  
Chahine SA, 1996, ANN TELECOMMUN, V51, P11
[6]  
DESHOURS F, 1994, C PREC EL MEAS DIG C, P294
[8]   THRU-REFLECT-LINE - IMPROVED TECHNIQUE FOR CALIBRATING THE DUAL 6-PORT AUTOMATIC NETWORK ANALYZER [J].
ENGEN, GF ;
HOER, CA .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1979, 27 (12) :987-993
[9]  
Gaquiere C., 1995, 25th European Microwave Conference 1995. Conference Proceedings, P339, DOI 10.1109/EUMA.1995.336975
[10]   AN AUTOMATED MILLIMETER-WAVE ACTIVE LOAD-PULL MEASUREMENT SYSTEM BASED ON 6-PORT TECHNIQUES [J].
GHANNOUCHI, FM ;
BOSISIO, RG .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (06) :957-962