Real-time XRD investigations during the formation of Cu(IngGa)Se2 Thin films

被引：3
作者：
Hergert, F
Jost, S
Hock, R
Purwins, M
机构：
[1] Univ Erlangen Nurnberg, Chair Crystallog & Struct Phys, D-91058 Erlangen, Germany
[2] Univ Erlangen Nurnberg, Dept Mat Sci 6, Crystal Growth Lab, D-91058 Erlangen, Germany
来源：
PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION | 2006年 / 22卷 / 06期
关键词：
phase transitions; solid-state reactions; thin-film solar cell; X-ray diffraction;
D O I：
10.1002/ppsc.200501003
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Knowledge of the solid-state reactions providing the synthesis of the absorber material Cu(IngGa)Se-2 well below its melting point is an essential prerequisite for the further optimization of the technologically relevant production processes. Therefore, powder XRD has been applied as nondestructive tool to follow chemical solide-state reactions in-situ. Subsequent Rietveld refinement provides the quantitative phase evolution time.
引用
收藏
页码：423 / 426
页数：4
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