An algebraic approach for test generation in iterative logic networks

被引：0

作者：

Seghrouchni, MA ^{[1
]}

Eleuldj, M ^{[1
]}

机构：

[1] EMI, Dept Genie Informat, Rabat, Morocco

来源：

ICM 2001: 13TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS | 2001年

关键词：

iterative logic networks; test; fault model;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper deals with a generalisation of test concepts for iterative logic networks. We present an algebraic approach for test generation in iterative logic networks. The generated test is under the stuck-at fault model [Feng 81b] and the functional fault model [Eleu 88]. Three types of tests are defined : the U-test, NU-test and M-test.

引用

页码：217 / 221

页数：5