An Analytical Jitter Tolerance Model for DLL-Based Clock and Data Recovery Circuits

被引:5
作者
Ryu, Kyungho [1 ]
Lee, Kil-Hoon [1 ]
Lim, Jung-Pil [1 ]
Kim, Jinho [1 ]
Pae, Hansu [1 ]
Park, Junho [1 ]
Lim, Hyun-Wook [1 ]
Lee, Jae-Youl [1 ]
机构
[1] Samsung Elect, Syst LSI Business, Hwaseong 18448, South Korea
关键词
Jitter; Clocks; Phase locked loops; Data models; Integrated circuit modeling; Analytical models; Receivers; Clock and data recovery (CDR); delay-locked loop (DLL); jitter tolerance; phase-locked loop (PLL); serial link; BANG-BANG CLOCK;
D O I
10.1109/TVLSI.2020.3018794
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This article presents the theoretical analyses and experimental results about jitter tolerance for delay-locked loop (DLL)-based clock and data recovery (CDR), which is generally used in an embedded clock serial link. From the proposed S-domain model, we prove that DLL-based CDR has superior low-frequency jitter tolerance than PLL-based CDR, whereas, assuming the ideal case, high-frequency jitter tolerance of DLL-based CDR is only a half of that of PLL-based CDR. In addition, the jitter tolerance characteristics of both PLL- and DLL-based CDRs are analyzed in a practical environment. Finally, the consistency of analysis is verified from measurement results using 2.7-Gb/s enhanced reduced-voltage differential signaling (eRVDS) receiver.
引用
收藏
页码:2257 / 2267
页数:11
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