Comparing two measurement techniques for high frequency characterization of power cable semi-conducting and insulating materials

被引：15
|
作者：
Mugala, Gavita
Eriksson, Roland
Pettersson, Per
机构：
[1] Royal Inst Technol KTH, Dept Elect Engn, S-10044 Stockholm, Sweden
[2] Vattenfall Utveckling AB, Stockholm, Sweden
来源：
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 2006年 / 13卷 / 04期
关键词：
complex permittivity; scattering parameters; insulation; semi-conducting; two-port; one-port; high frequency; measurements; characterization;
D O I：
10.1109/TDEI.2006.1667728
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Understanding the high frequency characteristics of the materials that make up medium voltage extruded cables is important in establishing diagnostics schemes based on electromagnetic pulse propagation methods. Two measurement techniques have been developed and used to characterize the high frequency material properties of semi-conducting screens and cross linked polyethylene (XLPE) insulation up to 100 MHz. The experimental details, parameter extraction and limitations of the two measurement techniques are presented.
引用
收藏
页码：712 / 716
页数：5
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