Field effect transistors based on poly(3-hexylthiophene) at different length scales

被引:70
|
作者
Mas-Torrent, M
den Boer, D
Durkut, M
Hadley, P
Schenning, APHJ
机构
[1] Delft Univ Technol, Dept NanoSci, NL-2628 CJ Delft, Netherlands
[2] Eindhoven Univ Technol, Lab Macromol & Organ Chem, NL-5600 MB Eindhoven, Netherlands
关键词
D O I
10.1088/0957-4484/15/4/028
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper we report on thin film transistors based on drop casting solutions of regioregular poly(3-hexylthiophene) (P3HT) over prefabricated gold electrodes. This polymer is known to self-organize into a lamellar structure in chloroform resulting in high field-effect mobilities. We studied the dependency of the charge carrier mobility of devices prepared from solution in chloroform with electrode spacings ranging from 5 mum to 20 nm. It was found that the overall trend was that the mobility decreased as the electrode spacing was made smaller, indicating that the transport properties on closely spaced electrodes were dominated by the contacts. Applying an ac voltage during the preparation of such films resulted in lower mobilities. However, P3HT in p-xylene forms fibres, which were aligned between the electrodes by applying an ac field. Films of aligned fibres with mobilities as high as 0.04 cm(2) V-1 s(-1) were prepared.
引用
收藏
页码:S265 / S269
页数:5
相关论文
共 50 条
  • [1] Effect of Self-Assembled Monolayers on Charge Injection and Transport in Poly(3-hexylthiophene)-Based Field-Effect Transistors at Different Channel Length Scales
    Singh, K. A.
    Nelson, T. L.
    Belot, J. A.
    Young, T. M.
    Dhumal, N. R.
    Kowalewski, T.
    McCullough, R. D.
    Nachimuthu, P.
    Thevuthasan, S.
    Porter, L. M.
    ACS APPLIED MATERIALS & INTERFACES, 2011, 3 (08) : 2973 - 2978
  • [2] Field-effect transistors based on poly(3-hexylthiophene): Effect of impurities
    Urien, Mathieu
    Wantz, Guillaume
    Cloutet, Eric
    Hirsch, Lionel
    Tardy, Pascal
    Vignau, Laurence
    Cramail, Henri
    Parniex, Jean-Paul
    ORGANIC ELECTRONICS, 2007, 8 (06) : 727 - 734
  • [3] On the Performance Degradation of Poly(3-Hexylthiophene) Field-Effect Transistors
    Cavallari, Marco R.
    Zanchin, Vinicius R.
    Valle, Marcio A.
    Izquierdo, Jose. E.
    Rodriguez, Eduardo M.
    Rodriguez, Estrella F. G.
    Pereira-da-Silva, Marcelo A.
    Fonseca, Fernando J.
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015, 15 (03) : 342 - 351
  • [4] Poly(3-hexylthiophene) crystalline nanoribbon network for organic field effect transistors
    Arif, M.
    Liu, Jianhua
    Zhai, Lei
    Khondaker, Saiful I.
    APPLIED PHYSICS LETTERS, 2010, 96 (24)
  • [5] Detailed investigation of the conducting channel in poly(3-hexylthiophene) field effect transistors
    von Hauff, Elizabeth
    Johnen, Fabian
    Tunc, Ali Veysel
    Govor, Leonid
    Parisi, Juergen
    JOURNAL OF APPLIED PHYSICS, 2010, 108 (06)
  • [6] Time dependent evolution of the carrier mobility in poly(3-hexylthiophene) based field effect transistors
    Devine, Roderick A. B.
    Journal of Applied Physics, 2006, 100 (03):
  • [7] Influence of processing conditions on the stability of poly(3-hexylthiophene)-based field-effect transistors
    Majewski, L. A.
    Kingsley, J. W.
    Balocco, C.
    Song, A. M.
    APPLIED PHYSICS LETTERS, 2006, 88 (22)
  • [8] Comparative study on different annealing methods and choice of solvent in organic field effect transistors based on Poly(3-hexylthiophene)
    Chua, C. L.
    Woon, K. L.
    MATERIALS SCIENCE-POLAND, 2013, 31 (03) : 325 - 330
  • [9] A comparative study of spin coated and floating film transfer method coated poly (3-hexylthiophene)/poly (3-hexylthiophene)-nanofibers based field effect transistors
    Tiwari, Shashi
    Takashima, Wataru
    Nagamatsu, S.
    Balasubramanian, S. K.
    Prakash, Rajiv
    JOURNAL OF APPLIED PHYSICS, 2014, 116 (09)
  • [10] Fabrication and characterization of poly(3-hexylthiophene)-based field-effect transistors with silsesquioxane gate insulators
    Tomatsu, Kenji
    Hamada, Takashi
    Nagase, Takashi
    Yamazaki, Saori
    Kobayashi, Takashi
    Murakami, Shuichi
    Matsukawa, Kimihiro
    Naito, Hiroyoshi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (04) : 3196 - 3199