共 23 条
[1]
CHRISTENSEN FE, 1992, P SOC PHOTO-OPT INS, V1546, P160, DOI 10.1117/12.51230
[2]
HIGH-RESOLUTION X-RAY-SCATTERING STUDIES OF SUBSTRATES AND MULTILAYERS
[J].
REVUE DE PHYSIQUE APPLIQUEE,
1988, 23 (10)
:1701-1710
[3]
OPTICS FOR THE X-RAY-IMAGING CONCENTRATORS ABOARD THE X-RAY ASTRONOMY SATELLITE SAX
[J].
APPLIED OPTICS,
1988, 27 (08)
:1470-1475
[4]
Characteristics of the flight model optics for the JET-X telescope onboard the SPECTRUM X-gamma satellite
[J].
MULTILAYER AND GRAZING INCIDENCE X-RAY/EUV OPTICS III,
1996, 2805
:56-65
[5]
CITTERIO O, 1995, IMAGING HIGH ENERGY, P229
[6]
del Rio M. Sanchez, 1998, SPIE P, V3448, P340
[7]
Characterization of sputtered nickel/carbon multilayers with soft-x-ray reflectivity measurements
[J].
APPLIED OPTICS,
1997, 36 (25)
:6329-6334
[8]
FURUZAWA A, 1998, SPIE P, V3444, P576
[9]
HARRISON F, 1999, IN PRESS SPIE P, V3765
[10]
HUSSEIN AH, 1999, SPIE P, V3766