Atomic Layer Deposition of ZrO2 and HfO2 Nanotubes by Template Replication

被引:27
|
作者
Gu, Diefeng [1 ,2 ]
Baumgart, Helmut [1 ,2 ]
Namkoong, Gon [1 ,2 ]
Abdel-Fattah, Tarek M. [2 ,3 ]
机构
[1] Old Dominion Univ, Dept Elect Engn, Norfolk, VA 23529 USA
[2] Appl Res Ctr, Newport News, VA 23606 USA
[3] Christopher Newport Univ, Dept Biol Chem & Environm Sci, Newport News, VA 23606 USA
关键词
atomic layer deposition; hafnium compounds; nanotechnology; nanotubes; porosity; scanning electron microscopy; X-ray chemical analysis; zirconium compounds; FABRICATION; MEMBRANES; ARRAYS;
D O I
10.1149/1.3070617
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Highly ordered zirconia and hafnia nanotubes were fabricated by atomic layer deposition (ALD) within the anodic alumina oxide (AAO) template. Scanning electron microscopy and energy-dispersive spectroscopy were used to characterize the morphology and elemental compositions of the different ALD coatings. The diameters of the AAO pores are in the range of 200-300 nm with a thickness of 60 mu m. The results indicated that the freestanding nanotubes were uniformly grown through the entire template thickness. The ALD process conformally replicated the AAO template dimensions. The number of ALD cycles controlled the resultant nanotube wall thickness.
引用
收藏
页码:K25 / K28
页数:4
相关论文
共 50 条
  • [41] Phase formation in the ZrO2 — HfO2 — Gd2O3 and ZrO2 — HfO2 — Yb2O3 systems
    A. G. Karaulov
    E. I. Zoz
    Refractories and Industrial Ceramics, 1999, 40 : 479 - 483
  • [42] Synapse and resistance switching behavior of La:HfO2/ZrO2/La:HfO2 memristors
    Su, Yong-Jun
    Jiang, Yan-Ping
    Tang, Jia-Yu
    Tang, Xin-Gui
    Tang, Zhenhua
    Guo, Xiao-Bin
    Li, Wen-Hua
    Zhou, Yichun
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2025,
  • [43] Thin films of HfO2 and ZrO2 as potential scintillators
    Kirm, M
    Aarik, J
    Jürgens, M
    Sildos, I
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 537 (1-2): : 251 - 255
  • [44] CRYSTALLIZATION OF ZRO2 AND HFO2 UNDER HYDROTHERMAL CONDITIONS
    KUZNETSO.VA
    SIDORENK.OV
    SOVIET PHYSICS CRYSTALLOGRAPHY, USSR, 1969, 13 (04): : 651 - &
  • [45] PRODUCTION OF REACTOR-GRADE ZRO2 AND HFO2
    FOLEY, E
    JOURNAL OF METALS, 1980, 32 (12): : 87 - 87
  • [46] Structural and dielectric properties of amorphous ZrO2 and HfO2
    Ceresoli, Davide
    Vanderbilt, David
    PHYSICAL REVIEW B, 2006, 74 (12):
  • [47] Electronic structure differences in ZrO2 vs HfO2
    Zheng, WJ
    Bowen, KH
    Li, J
    Dabkowska, I
    Gutowski, M
    JOURNAL OF PHYSICAL CHEMISTRY A, 2005, 109 (50): : 11521 - 11525
  • [48] INTERMEDIATE COMPOUNDS IN SYSTEMS ZRO2(HFO2)-MGO
    GAVRISH, AM
    ZOZ, EI
    INORGANIC MATERIALS, 1978, 14 (01) : 139 - 141
  • [49] NEW HIGH PRESSURE MODIFICATIONS OF ZRO2 AND HFO2
    BENDELIANI, NA
    POPOVA, SV
    VERESCHA.LP
    GEOCHEMISTRY INTERNATIONAL, 1967, 4 (03) : 557 - +
  • [50] Introducing densification mechanisms into the modelling of HfO2 atomic layer deposition
    Mastail, C.
    Lanthony, C.
    Olivier, S.
    Ducere, J. -M.
    Landa, G.
    Esteve, A.
    Rouhani, M. Djafari
    Richard, N.
    Dkhissi, A.
    THIN SOLID FILMS, 2012, 520 (14) : 4559 - 4563