Synthesis and characterization of antireflective Ag@AgCl nanocomposite thin films

被引：10
|
作者：
Nehal, M. El. F. [1 ]
Bouzidi, A. [1 ]
Nakrela, A. [1 ]
Miloua, R. [1 ,2 ]
Medles, M. [1 ]
Desfeux, R. [3 ]
Blach, J-F. [3 ]
Simon, P. [3 ]
Huve, M. [3 ]
机构：
[1] Univ Djillali Liabes Sidi Bel Abbes, Lab Elaborat & Caracterisat Mat, BP 89, Sidi Bel Abbes 22000, Algeria
[2] Univ Ibn Khaldoun, Fac Sci Nat & Vie, Tiaret 14000, Algeria
[3] Univ Lille, Univ Artois, Unite Catalyse & Chim Solide UCCS, CNRS,Cent Lille,ENSCL,UMR 8181, F-62300 Lens, France
来源：
OPTIK | 2020年 / 224卷
关键词：
Silver chloride; XRD; TEM; Raman; XPS; Localized surface plasmon resonance; Antireflecting films; RAY PHOTOELECTRON-SPECTROSCOPY; SILVER; NANOPARTICLES; XPS; MICROSTRUCTURE; ANTIBACTERIAL; DEPOSITION; STRAIN;
D O I：
10.1016/j.ijleo.2020.165568
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Silver chloride thin films were easily prepared for the first time by direct spraying of silver chloride (AgCl) solution with low molarity on glass substrates heated at 200 degrees C, 250 degrees C, 300 degrees C and 350 degrees C. The X-ray diffraction (XRD) data showed that the films have cubic symmetry and are subject to compressive and tensile strains. Transmission electron microscopy revealed the presence of Ag nanoparticles (NPs) of different sizes embedded in AgCl thin films. These nanoparticles were roughly spherical and well crystallized in the case of the film prepared at 350 degrees C. The Raman and X-ray photoelectron spectroscopy confirmed the XRD results. The UV-vis-NIR spectroscopy indicated a low reflectance with antireflecting properties and high optical transmission superior to 80 % at 350 degrees C. The obtained films have wide indirect band gap and exhibit localized surface plasmon resonance (LSPR) peak at 407 nm at deposition temperature of 350 degrees C due to the presence of Ag NPs.
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页数：14
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