Ion beam analysis of pottery from Teotihuacan, Mexico

被引:16
作者
Salamanca, MAO
Ruvalcaba-Sil, JL
Bucio, L
Manzanilla, L
Miranda, J
机构
[1] Ctr Nacl Aceleradores, E-41092 Seville, Spain
[2] Univ Sevilla, Dpto Fis Atom Mol & Nucl, E-41080 Seville, Spain
[3] Univ Nacl Autonoma Mexico, Inst Fis, Mexico City 01000, DF, Mexico
[4] Univ Nacl Autonoma Mexico, Inst Invest Antropol, Mexico City 04510, DF, Mexico
关键词
PIXE; RBS; XRD; archaeology; pottery; pigments; Teotihuacan; Epiclassic; Postclassic;
D O I
10.1016/S0168-583X(99)00844-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This work presents the characterization of sherds and pottery paints from Teotihuacan. Mexico, belonging to the Mesoamerican Epiclassic (700-900 AD) and Postclassic (900-1521 AD) periods. A simultaneous analysis by Particle Induced X-ray Emission (PIXE) and Rutherford Backscattering Spectroscopy (RBS) was carried out to measure the elemental composition of pottery and clays sources of the Teotihuacan region. Also, a semiquantitative X-Ray Diffraction study (XRD) was performed to determine the mineralogical phases. From elemental and mineralogical composition, groups of local and foreign sherds were established. Results showed that the PIXE-RBS method combined with XRD proved to be a very powerful and general procedure for archaeological characterization. Moreover, non-vacuum differential PIXE analysis was carried out on colored regions of some representative vessels to study the layered structure of the paints-clay system. (C) 2000 Elsevier Science B.V. All rights reserved.
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页码:762 / 768
页数:7
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