Transient current mapping obtained from silicon photodiodes using focused ion microbeams with several hundreds of MeV

被引：11
作者：
Hirao, T. [1 ]
Onoda, S. [1 ]
Oikawa, M. [1 ,2 ]
Satoh, T. [1 ]
Kamiya, T. [1 ]
Ohshima, T. [1 ]
机构：
[1] Japan Atom Energy Agcy, Gunma 3701292, Japan
[2] Gunma Univ, Gunma 3718511, Japan
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2009年 / 267卷 / 12-13期
关键词：
Single Event Effect (SEE); High-energy heavy ion microbeam; Transient Ion Beam induced Current (TIBIC); mapping; INDUCED CHARGE; SYSTEM;
D O I：
10.1016/j.nimb.2009.03.051
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Single Event Effects (SEEs) triggered by energetic heavy ions traversing a sensitive parts of electric devices have been studied using high-energy heavy ion microbeams connected with Transient Ion Beam Induced Current (TIBIC) measuring system at the Japan Atomic Energy Agency (JAEA) Takasaki Ion Accelerators for Advanced Radiation Applications (TIARA) facility. In the TIBIC system, SEE for semiconductor device, that is fast charge collection, has been observed in timescales of the order of picoseconds. In this paper, we show successful demonstration of the performance of the system, in which clear images of TIBIC map have been observed for Si pin photodiodes irradiated by 260 MeV (20)Ne(7+) and also by 520 Me (40)Ar(14+) microbeams. (c) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码：2216 / 2218
页数：3
相关论文
共 11 条
  • [1] [Anonymous], HDB IMPLANTATION TEC
  • [2] BARTH J, 1997, P IEEE NSREC SHORT C
  • [3] A review of ion beam induced charge microscopy
    Breese, M. B. H.
    Vittone, E.
    Vizkelethy, G.
    Sellin, P. J.
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 264 (02) : 345 - 360
  • [4] KURASHIMA S, 2008, ICNMTA
  • [5] High-injection carrier dynamics generated by MeV heavy ions impacting high-speed photodetectors
    Laird, JS
    Hirao, T
    Onoda, S
    Itoh, H
    [J]. JOURNAL OF APPLIED PHYSICS, 2005, 98 (01)
  • [6] Development of a new data collection system and chamber for microbeam and laser investigations of single event phenomena
    Laird, JS
    Hirao, T
    Mori, H
    Onoda, S
    Kamiya, T
    Itoh, H
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2001, 181 : 87 - 94
  • [7] NASHIYAMA I, 1993, IEEE T NUCL SCI, V40, P1935, DOI 10.1109/23.273461
  • [8] Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron
    Oikawa, Masakazu
    Satoh, Takahiro
    Sakai, Takuro
    Miyawaki, Nobumasa
    Kashiwagi, Hirotsugu
    Kurashima, Satoshi
    Okumura, Susumu
    Fukuda, Mitsuhiro
    Yokota, Watalu
    Kamiya, Tomihiro
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 260 (01) : 85 - 90
  • [9] Transient currents generated by heavy ions with hundreds of MeV
    Onoda, S.
    Hirao, T.
    Laird, J. S.
    Mishima, K.
    Kawano, K.
    Itoh, H.
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (06) : 3731 - 3737
  • [10] Development of Monte Carlo modeling for proton induced charge in Si pin photodiode
    Onoda, S
    Hirao, T
    Laird, JS
    Wakasa, T
    Yamakawa, T
    Okamoto, T
    Koizumi, Y
    Kamiya, T
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (05) : 2770 - 2775
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