Acoustic phonon propagation in ultra-thin Si membranes under biaxial stress field

被引:15
作者
Graczykowski, B. [1 ]
Gomis-Bresco, J. [1 ]
Alzina, F. [1 ]
Reparaz, J. S. [1 ]
Shchepetov, A. [2 ]
Prunnila, M. [2 ]
Ahopelto, J. [2 ]
Sotomayor Torres, C. M. [1 ,3 ]
机构
[1] ICN2 Inst Catala Nanociencia & Nanotecnol, E-08193 Bellaterra, Barcelona, Spain
[2] VTT Tech Res Ctr Finland, FI-02044 Espoo, Finland
[3] ICREA Inst Catalana Recerca & Estudis Avancats, E-08010 Barcelona, Spain
基金
芬兰科学院;
关键词
acoustic phonons; ultra-thin Si membranes; Brillouin light scattering; DEFORMATION POTENTIALS; BRILLOUIN-SCATTERING; SEMICONDUCTORS; MODE;
D O I
10.1088/1367-2630/16/7/073024
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report on stress induced changes in the dispersion relations of acoustic phonons propagating in 27 nm thick single crystalline Si membranes. The static tensile stress (up to 0.3 GPa) acting on the Si membranes was achieved using an additional strain compensating silicon nitride frame. Dispersion relations of thermally activated hypersonic phonons were measured by means of Brillouin light scattering spectroscopy. The theory of Lamb wave propagation is developed for anisotropic materials subjected to an external static stress field. The dispersion relations were calculated using the elastic continuum approximation and taking into account the acousto-elastic effect. We find an excellent agreement between the theoretical and the experimental dispersion relations.
引用
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页数:12
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