In-situ x-ray absorption fine structure and x-ray diffraction studies of hydrogen intercalation in tungsten oxides

被引：9

作者：

Purans, J

Kuzmin, A

Guery, C

机构：

来源：

OPTICAL ORGANIC AND SEMICONDUCTOR INORGANIC MATERIALS | 1997年 / 2968卷

关键词：

XAFS; XRD; tungsten oxides; structure; hydrogen intercalation;

D O I：

10.1117/12.266830

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present in-situ x-ray absorption fine structure (XAFS) (at the W L(3)-edge) and x-ray diffraction (XRD) studies of hydrogen intercalation into stable monoclinic (m-WO3) and metastable hexagonal (h-WO3) and cubic (c-WO3) phases of tungsten oxide. The analysis of XAFS and XRD data allowed us to reconstruct the local environment around tungsten ions in the first coordination shell. The obtained results are compared with the existing structural models.

引用

页码：174 / 179

页数：6