New ray-tracing capabilities for the development of Silicon Pore Optics

被引：4

作者：

Vacanti, Giuseppe ^{[1
]}

Barriere, Nicolas ^{[1
]}

Chatbi, Abdelhakim ^{[1
]}

Collon, Maximilien ^{[2
]}

Gunther, Ramses ^{[1
]}

Yanson, Alexei ^{[1
]}

Vervest, Mark ^{[1
]}

Bavdaz, Marcos ^{[3
]}

Wille, Eric ^{[3
]}

机构：

[1] Cosine Sci & Comp BV, NL-2333 CH Leiden, Netherlands

[2] Cosine Res BV, NL-2333 CH Leiden, Netherlands

[3] European Space Agcy, NL-2200 AG Noordwijk, Netherlands

来源：

OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY VII | 2015年 / 9603卷

关键词：

X-ray optics; X-ray astronomy; Si Icon Pore Optics; X-ray telescopes; X-ray testing; ray tracing;

D O I：

10.1117/12.2188133

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

The Geant4 based ray-tracer used to support the development of Silicon Pore Optics is being extended to take into account more subtle effects that affect the performance of the optics, like thermo-mechanical stresses and detailed surface metrology. Its performance has also been increased to make it possible to simulate rapidly and in detail the optics of Athena so that various possible configurations can be explored and characterized providing important feedback to the development and system teams. In this paper we report on the state of the development.

引用

页数：4

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