Resonant inelastic soft x-ray scattering of CdS: A two-dimensional electronic structure map approach

被引：36
作者：
Weinhardt, L. [1 ,2 ]
Fuchs, O. [1 ]
Fleszar, A. [2 ]
Baer, M. [2 ]
Blum, M. [1 ,2 ]
Weigand, M. [1 ]
Denlinger, J. D. [3 ]
Yang, W. [3 ]
Hanke, W. [2 ]
Umbach, E. [1 ,4 ]
Heske, C. [2 ]
机构：
[1] Univ Wurzburg, D-97074 Wurzburg, Germany
[2] Univ Nevada, Dept Chem, Las Vegas, NV 89154 USA
[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
[4] FZ Karlsruhe, D-76344 Eggenstein Leopoldshafen, Germany
来源：
PHYSICAL REVIEW B | 2009年 / 79卷 / 16期
关键词：
band structure; cadmium compounds; density functional theory; fluorescence; II-VI semiconductors; wave functions; X-ray scattering; SOLAR-CELL HETEROJUNCTION; BAND-STRUCTURE; FLUORESCENCE; NANOCRYSTALS; LUMINESCENCE; ABSORPTION; SPECTRA; SOLIDS; ZNS;
D O I：
10.1103/PhysRevB.79.165305
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Resonant inelastic x-ray scattering (RIXS) with soft x rays is uniquely suited to study the electronic structure of a variety of materials, but is currently limited by low (fluorescence yield) count rates. This limitation is overcome with a high-transmission spectrometer that allows to measure soft x-ray RIXS "maps." The S L(2,3) RIXS map of CdS is discussed and compared with density-functional calculations. The map allows the extraction of decay channel-specific "absorption spectra" giving detailed insight into the wave functions of occupied and unoccupied electronic states.
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页数：5
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