Argon gas, by near-ambient pressure XPS

被引：6

作者：

Patel, Dhananjay I. ^{[1
]}

Bahr, Stephan ^{[2
]}

Dietrich, Paul ^{[2
]}

Meyer, Michael ^{[2
]}

Thissen, Andreas ^{[2
]}

Linford, Matthew R. ^{[1
]}

机构：

[1] Brigham Young Univ, Dept Chem & Biochem, C100 BNSN, Provo, UT 84602 USA

[2] SPECS Surface Nano Anal GmbH, Voltastr 5, D-13355 Berlin, Germany

来源：

SURFACE SCIENCE SPECTRA | 2019年 / 26卷 / 01期

关键词：

near-ambient pressure x-ray photoelectron spectroscopy; NAP-XPS; XPS; water vapor; PHOTOELECTRON-SPECTROSCOPY;

D O I：

10.1116/1.5110408

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Near-ambient pressure-x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500Pa. With NAP-XPS, XPS can analyze moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey, 2s, 2p, 3s, 3p, and the Auger LMM NAP-XPS spectra from argon gas, a material that could not be analyzed at moderate pressures by conventional methods. A small N 1s signal from residual nitrogen gas in the chamber is also present in the survey spectrum.

引用

页数：7

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