Substrate temperature effect on structural, electronic and optical properties of V2O5 thin films: experimental and ab initio study

被引：4

作者：

Temsamani, Rajae ^{[1
]}

Talbi, Abdelali ^{[2
]}

Mrigal, Asmaa ^{[2
]}

Addou, Mohammed ^{[1
,2
]}

Nouneh, Khalid ^{[2
]}

Gueddouch, Karima ^{[1
]}

Zaari, Halima ^{[3
]}

机构：

[1] Abdelmalek Essadi Univ, Fac Sci & Technol, Res Team Thin Films & Nanomat ERCMN, Tangier, Morocco

[2] Ibn Tofail Univ, Fac Sci, Dept Phys, Lab Mat Phys & Subatom, BP 242, Kenitra 14000, Morocco

[3] Univ Mohammed 5, Lab Condensed Matter & Interdisciplinary Sci LaMC, Rabat, Morocco

来源：

EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 2020年 / 92卷 / 01期

关键词：

VANADIUM PENTOXIDE FILMS; ELECTRICAL-PROPERTIES; SURFACE; GROWTH; GLASS; ZNTE;

D O I：

10.1051/epjap/2020200154

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Optical, structural and electronic properties of vanadium pentoxide (V2O5) thin films deposited with different values of substrate temperature have been investigated. First principles calculations were performed using the Full Potential Projector-Augmented Wave (PAW) method with the Generalized Gradient Approximation (GGA) implemented in Quantum Espresso code. The results are very promising and show that the temperature has an important effect on V2O5 thin films features. Dielectric functions for different thin films are calculated for 14-atom orthorhombic super-cell structure. The calculated band gaps are fitted with a linear equation: (alpha hv)(2)=A(hv-E-g). For all types of deposited thin films the position of critical points (CPs) E-0, E-1 and E-2 show good agreement with the experimental data.

引用

页数：10

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