Counting statistics of coherent population trapping in quantum dots

被引：61
作者：
Groth, C. W. [1 ]
Michaelis, B. [1 ]
Beenakker, C. W. J. [1 ]
机构：
[1] Leiden Univ, Inst Lorentz, NL-2300 RA Leiden, Netherlands
来源：
PHYSICAL REVIEW B | 2006年 / 74卷 / 12期
关键词：
D O I：
10.1103/PhysRevB.74.125315
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Destructive interference of single-electron tunneling between three quantum dots can trap an electron in a coherent superposition of charge on two of the dots. Coupling to external charges causes decoherence of this superposition, and in the presence of a large bias voltage each decoherence event transfers a certain number of electrons through the device. We calculate the counting statistics of the transferred charges, finding a crossover from sub-Poissonian to super-Poissonian statistics with increasing ratio of tunnel and decoherence rates.
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