Molecule-dependent topography determined by noncontact atomic force microscopy:: carboxylates on TiO2 (110)

被引：22

作者：

Onishi, H ^{[1
]}

Sasahara, A ^{[1
]}

Uetsuka, H ^{[1
]}

Ishibashi, TA ^{[1
]}

机构：

[1] Kanagawa Acad Sci & Technol, Surface Chem Lab, Takatsu Ku, Kawasaki, Kanagawa 2130012, Japan

来源：

APPLIED SURFACE SCIENCE | 2002年 / 188卷 / 3-4期

关键词：

atomic force microscopy; surface structure; morphology; chemisorption; carboxylic acid; titanium oxide; low index single crystal surfaces; semiconducting surfaces;

D O I：

10.1016/S0169-4332(01)00935-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The feasibility of noncontact atomic force microscopy (NC-AFM) in single-molecule analysis is experimentally demonstrated. Carboxylates (RCOO-) with different R's were identified molecule-by-molecule on the TiO2(1 1 0) substrate. The constant frequency-shift topography exhibited a good correlation with the physical topography of the carboxylates with R=H, CH3, C(CH3)(3) and C=CH. The molecule-dependent topography was interpreted with the van der Waals force pulling the tip into the adsorbates. The constant frequency-shift topography of a series of fluorine-containing acetates (R=CH3, CHF2, and CF3) revealed that the intramolecular electric polarization perturbs the tip-molecule force through electrostatic couplings. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：257 / 264

页数：8

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