Fe and N self-diffusion in amorphous FeN: A SIMS and neutron reflectivity study

被引:20
作者
Chakravarty, S. [1 ]
Gupta, M. [1 ]
Gupta, A. [1 ]
Rajagopalan, S. [2 ]
Balamurugan, A. K. [2 ]
Tyagi, A. K. [2 ]
Deshpande, U. P. [1 ]
Horisberger, M. [3 ,4 ]
Gutberlet, T. [3 ,4 ]
机构
[1] UGC DAE Consortium Sci Res, Indore 452017, Madhya Pradesh, India
[2] Indira Gandhi Ctr Atom Res, MSD, Surface Sci Sect, Kalpakkam 603102, Tamil Nadu, India
[3] ETH, Neutron Scattering Lab, CH-5232 Villigen, Switzerland
[4] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
关键词
Amorphous FeN; Self-diffusion; Mass spectroscopy; Neutron reflectivity; IMPURITY DIFFUSION; METALLIC GLASSES; ALLOYS; FE40NI40B20; FILMS;
D O I
10.1016/j.actamat.2008.11.008
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Simultaneous self-diffusion Measurements of Fe and N in amorphous Fe86N14 alloy using secondary ion mass spectroscopy (SIMS) arc reported. In addition, neutron reflectivity (NR) was used to study the Fe self-diffusion in the same compound. The broadening of a tracer layer of (Fe86N14)-Fe-57-N-15 sandwiched between Fe86N14 layers was observed by SIMS measurements after the annealing of films at different temperatures. A decay of the Bragg peak intensity after isothermal annealing was also observed in [Fes(86)N(14)/Fe-57(86) N-14](10) multilayers in NR. It was observed by SIMS measurements that Fe diffusion was about 2 orders of magnitude smaller than N, even though the structural relaxation times for Fe and N were almost identical. This is an important result, indicating that the relaxation time of diffusion is basically driven by the relaxation of the structure itself. (C) 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:1263 / 1271
页数:9
相关论文
共 29 条
[21]   SOME CORRELATIONS FOR DIFFUSION IN AMORPHOUS-ALLOYS [J].
SHARMA, SK ;
BANERJEE, S ;
KULDEEP ;
JAIN, AK .
JOURNAL OF MATERIALS RESEARCH, 1989, 4 (03) :603-606
[22]  
SHEWMON PG, 1963, DIFFUSION SOLIDS, P7
[23]   The study of self-diffusion in crystalline and amorphous multilayer samples by neutron reflectometry [J].
Speakman, J ;
Rose, P ;
Hunt, JA ;
Cowlam, N ;
Somekh, RE ;
Greer, AL .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1996, 156 (1-3) :411-412
[24]   DIFFUSION-COEFFICIENTS OF NI-63 IN FE40NI40B20 METALLIC-GLASS [J].
TYAGI, AK ;
MACHT, MP ;
NAUNDORF, V .
ACTA METALLURGICA ET MATERIALIA, 1991, 39 (04) :609-617
[25]  
UTZIG J, 1997, J APPL PHYS, V65, P3638
[26]   Interdiffusion in nanometer-scale multilayers investigated by in situ low-angle x-ray diffraction [J].
Wang, WH ;
Bai, HY ;
Zhang, M ;
Zhao, JH ;
Zhang, XY ;
Wang, WK .
PHYSICAL REVIEW B, 1999, 59 (16) :10811-10822
[27]   Effect of substrate temperature and bias voltage on DC. magnetron sputtered Fe-N thin films [J].
Wang, X ;
Zheng, WT ;
Tian, HW ;
Yu, SS ;
Wang, LL .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2004, 283 (2-3) :282-290
[28]   TRIBOLOGICAL STUDIES OF ULTRAHIGH DOSE NITROGEN-IMPLANTED IRON AND STAINLESS-STEEL [J].
WEI, R ;
WILBUR, PJ ;
OZTURK, O ;
WILLIAMSON, DL .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 :731-736
[29]  
WIT L, 1994, PHYS REV LETT, V72, P3835