Inelastic electron interaction (attachment/ionization) with deoxyribose

被引:179
作者
Ptasinska, S
Denifl, S
Scheier, P
Märk, TD
机构
[1] Leopold Franzens Univ Innsbruck, Inst Ionenphys, A-6020 Innsbruck, Austria
[2] Comenius Univ, Dept Plasmaphys, SK-84248 Bratislava, Slovakia
关键词
D O I
10.1063/1.1690231
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have investigated experimentally the formation of anions and cations of deoxyribose sugar (C5H10O4) via inelastic electron interaction (attachment/ionization) using a monochromatic electron beam in combination with a quadrupole mass spectrometer. The ion yields were measured as a function of the incident electron energy between about 0 and 20 eV, As in the case of other biomolecules (nucleobases and amino acids), low energy electron attachment leads to destruction of the molecule via dissociative electron attachment reactions. In contrast to the previously investigated biomolecules dehydrogenation is not the predominant reaction channel for deoxyribose; the anion with the highest dissociative electron attachment (DEA) cross section of deoxyribose is formed by the release of neutral particles equal to two water molecules. Moreover, several of the DEA reactions proceed already with "zero energy" incident electrons. In addition, the fragmentation pattern of positively charged ions of deoxyribose also indicates strong decomposition of the molecule by incident electrons. For sugar the relative amount of fragment ions compared to that of the parent cation is about an order of magnitude larger than in the case of nucleobases. We determined an ionization energy value for C5H10O4+ of 10.51+/-0.11 eV, which is in good agreement with ab initio calculations. For the fragment ion C5H6O2+ we obtained a threshold energy lower than the ionization energy of the parent molecular ion. All of these results have important bearing for the question of what happens in exposure of living tissue to ionizing radiation. Energy deposition into irradiated cells produces electrons as the dominant secondary species. At an early time after irradiation these electrons exist as ballistic electrons with an initial energy distribution up to several tens of electron volts. It is just this energy regime for which we find in the present study rather characteristic differences in the outcome of electron interaction with the deoxyribose molecule compared to other nucleobases (studied earlier). Therefore, damage induced by these electrons to the DNA or RNA strands may start preferentially at the ribose backbone. In turn, damaged deoxyribose is known as a key intermediate in producing strand breaks, which arc the most severe form of lesion in radiation damage to DNA and lead subsequently to cell death. (C) 2004 American Institute of Physics.
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页码:8505 / 8511
页数:7
相关论文
共 50 条
[1]   Negative ions in thymine and 5-bromouracil produced by low energy electrons [J].
Abouaf, R ;
Pommier, J ;
Dunet, H .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2003, 226 (03) :397-403
[2]   Electron attachment energies of the DNA bases [J].
Aflatooni, K ;
Gallup, GA ;
Burrow, PD .
JOURNAL OF PHYSICAL CHEMISTRY A, 1998, 102 (31) :6205-6207
[3]   Temporary anion states of selected amino acids [J].
Aflatooni, K ;
Hitt, B ;
Gallup, GA ;
Burrow, FD .
JOURNAL OF CHEMICAL PHYSICS, 2001, 115 (14) :6489-6494
[4]   FAST ELECTRON REACTIONS IN CONCENTRATED SOLUTIONS OF AMINO-ACIDS AND NUCLEOTIDES [J].
ALDRICH, JE ;
LAM, KY ;
SHRAGGE, PC ;
HUNT, JW .
RADIATION RESEARCH, 1975, 63 (01) :42-52
[5]  
[Anonymous], 1971, Atomic and molecular radiation physics
[6]   Low-energy electron damage to condensed-phase deoxyribose analogues investigated by electron stimulated desorption of H- and electron energy loss spectroscopy [J].
Antic, D ;
Parenteau, L ;
Lepage, M ;
Sanche, L .
JOURNAL OF PHYSICAL CHEMISTRY B, 1999, 103 (31) :6611-6619
[7]   Electron-stimulated desorption of H- from condensed-phase deoxyribose analogues:: Dissociative electron attachment versus resonance decay into dipolar dissociation [J].
Antic, D ;
Parenteau, L ;
Sanche, L .
JOURNAL OF PHYSICAL CHEMISTRY B, 2000, 104 (19) :4711-4716
[8]   Mechanism for damage to DNA by low-energy electrons [J].
Barrios, R ;
Skurski, P ;
Simons, J .
JOURNAL OF PHYSICAL CHEMISTRY B, 2002, 106 (33) :7991-7994
[9]  
Boudaïffa B, 2000, SCIENCE, V287, P1658, DOI 10.1126/science.287.5458.1658
[10]  
Christophorou L. G., 1978, Advances in electronics and electron physics, vol.46, P55