X-ray characterization of sol-gel TiO2 thin films

被引：0
|
作者：
Angel Alterach, Miguel [1 ,2 ]
Roberto Rosenberger, Mario [1 ,2 ]
German Lamas, Diego [1 ]
Enrique Schvezov, Carlos [1 ,2 ]
Esther Ares, Alicia [1 ,2 ]
机构：
[1] Consejo Nacl Invest Cient & Tecn, Buenos Aires, DF, Argentina
[2] Univ Nacl Misiones, Posadas, Argentina
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2011年 / 67卷
关键词：
sol-gel; film; synchrotron;
D O I：
10.1107/S0108767311091495
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS21.P12
引用
收藏
页码：C339 / C339
页数：1
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