Characterization of TiO2 Doped Poly (methyl methacrylate) PMMA Thin Films Using XRD

被引：4

作者：

Pandey, Nisha ^{[1
]}

Khaling, Richa ^{[1
]}

Verma, Priyanka ^{[1
]}

Pendke, Poonam ^{[1
]}

Patel, Arunendra ^{[1
]}

机构：

[1] St Aloysius Coll, Dept Post Grad Studies & Res, Jabalpur 482001, MP, India

来源：

PROF. DINESH VARSHNEY MEMORIAL NATIONAL CONFERENCE ON PHYSICS AND CHEMISTRY OF MATERIALS (NCPCM 2018) | 2019年 / 2100卷

关键词：

Poly(Methyl Methacrylate); X-Ray Diffraction (XRD); IRRADIATION;

D O I：

10.1063/1.5098705

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the present work PMMA thin films by using different concentration of TiO2 as dopant were prepared. The films have been prepared by using solution cast method. The prepared films were characterized by X- ray diffraction (XRD) study. The XRD result shows that the film structure was changed from amorphous to crystalline nature by increasing the TiO2 doping concentration. The calculated crystallinity index of the TiO2 doped PMMA varied from 15.37% to 33.80% as the concentration is increased.

引用

页数：4

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