Noise generation and coupling mechanisms in deep-submicron ICs

被引：31

作者：

Aragonès, X ^{[1
]}

González, JL ^{[1
]}

Moll, F ^{[1
]}

Rubio, A ^{[1
]}

机构：

[1] Univ Politecn Cataluna, Dept Elect Engn, ES-08034 Barcelona, Spain

来源：

IEEE DESIGN & TEST OF COMPUTERS | 2002年 / 19卷 / 05期

关键词：

D O I：

10.1109/MDT.2002.1033789

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

On-chip noise generation and coupling is an important issue in deep-submicron technologies. Advanced IC technology faces new challenges to ensure function and performance integrity. Selecting adequate test techniques depends on the circuit, its implementation, and the possible physical failures and parasitic coupling models. This new demand for test technology practices precipitated the investigation of di/dt and dV/dt noise generation and propagation mechanisms.

引用

页码：27 / 35

页数：9

共 11 条

[1] Experimental comparison of substrate noise coupling using different wafer types [J].

Aragonès, X ;

Rubio, A .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1999, 34 (10) :1405-1409

[2] Principles of substrate crosstalk generation in CMOS circuits [J].

Briaire, J ;

Krisch, KS .

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2000, 19 (06) :645-653

[3]

CHANG Y, 2000, P 9 AS TEST S ATS 00, P305

[4]

Chen HH, 1997, DES AUT CON, P638, DOI 10.1145/266021.266307

[5] Test generation in VLSI circuits for crosstalk noise [J].

Chen, WY ;

Gupta, SK ;

Breuer, MA .

INTERNATIONAL TEST CONFERENCE 1998, PROCEEDINGS, 1998, :641-650

[6]

CUVIELLO M, 1999, P INT C COMP AID DES, P281

[7] Vector generation for power supply noise estimation and verification of deep submicron designs [J].

Jiang, YM ;

Cheng, KT .

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2001, 9 (02) :329-340

[8]

KRSTIC A, 1999, P INT TEST C, P181

[9] SPURIOUS SIGNALS IN DIGITAL CMOS VLSI CIRCUITS - A PROPAGATION ANALYSIS [J].

MOLL, F ;

RUBIO, A .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 1992, 39 (10) :749-752

[10]

Moll F., 1994, Proceedings of the Third Asian Test Symposium (Cat. No.94TH8016), P176, DOI 10.1109/ATS.1994.367232

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