Tailoring of amplification spectrum using dc-field for high-precision two-wave mixing adaptive interferometry with CdTe

被引:0
作者
Shcherbin, Konstantin [1 ]
Klein, Marvin B. [2 ]
Evans, Dean R. [3 ]
机构
[1] Natl Acad Sci, Inst Phys, Prospekt Nauki 46, UA-03680 Kiev, Ukraine
[2] Intelligent Opt Syst Inc, 2520 West 237th St, Torrance, CA 90505 USA
[3] Air Force Res Lab, Mat & Mfg Directorate, Wright Patterson AFB, OH 45433 USA
来源
OPTICAL, OPTO-ATOMIC, AND ENTANGLEMENT-ENHANCED PRECISION METROLOGY | 2019年 / 10934卷
关键词
Laser ultrasonics; dynamic holography; photorefractive effect; two-wave mixing; adaptive interferometer; photorefractive semiconductor; cadmium telluride; HOLOGRAPHIC STORAGE; VIBROMETRY; CRYSTAL; LIGHT;
D O I
10.1117/12.2514802
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Two-wave mixing adaptive interferometers based on photorefractive crystals allow for precise remote detection of small displacements. Using dynamic holograms, they compensate for ambient disturbances in factory environments and can process speckled beams with complicated wavefronts. Linear phase-to-intensity conversion with maximum sensitivity is achieved when the response becomes local when a dc-field is applied to the photorefractive crystal. In the present work we study experimentally the change of the shape of the amplification spectrum induced by a dc field in the two-wave mixing geometry. The shape of the spectrum is used for identification of the type of response (local or nonlocal). High sensitivity for detection of surface displacements is demonstrated for a two-wave mixing interferometer with a dc-biased CdTe:Ge crystal.
引用
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页数:7
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