Mossbauer investigation of Fe1-xCrx films grown by ion-beam sputter deposition

被引:4
作者
Eymery, J. P.
Al-Khoury, W.
Goudeau, Ph.
Fnidiki, A.
机构
[1] Univ Poitiers, UMR 6630 CNRS, Met Phys Lab, F-86962 Futuroscope, France
[2] Atom Energy Commiss Syria, Damascus, Syria
[3] Univ Rouen, UMR 6634 CNRS, Grp Phys Mat, F-76801 St Etienne, France
关键词
thin films; Mossbauer spectroscopy; x-ray diffraction;
D O I
10.1016/j.physb.2006.01.513
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Fe1-xCrx (0 < x < 0.70) films, 220nm thick, on Si and fused-SiO2 substrates were prepared using ion-beam sputter deposition, and their structural properties were determined by Fe-57 conversion electron Mossbauer spectroscopy (CEMS) and X-ray diffraction experiments (XRD) at room temperature. CEM spectra show magnetic ordering for 0 < x <= 0.28, and the BCC alpha-phase is evidenced through XRD diagrams in all cases. The general trend for the films is that the average hyperfine magnetic field (HMF) values are lower compared to bulk counterparts. Moreover, a parabolic change in average HMF with Cr content x could be established. For 0.32 <= x < 0.70, the CEM spectra exhibit a pseudo-single line, which denotes paramagnetic state. Between x=0.32 and x=0.38, there exists a multiphase region where the alloys mainly consist of alpha and delta (A15-type) phases. Then, in the concentration range x=0.38-0.58, the films only display the metastable delta-phase. For 0.58 <= x <= 0.66, there appears a new transition region where alpha- and delta-phases coexist. Finally, the domain of the paramagnetic alpha-phase alone stretches from x=0.66 to at least x=0.70. Emphasis is placed on the metastable delta-phase which appears over a wide monophase region. Particularly, the site occupancy could be determined through the CEM spectrum for x=0.49. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:297 / 305
页数:9
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