The effective resolution measurement in scope of sine-fit test

被引：0
|
作者：
Hejn, K
Kramarski, L
Pacut, A
机构：
来源：
IMTC/97 - IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE: SENSING, PROCESSING, NETWORKING, PROCEEDINGS VOLS 1 AND 2 | 1997年
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D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
This paper presents a detailed analysis of the efr measurement in the scope of the IEEE Standard 1057 sine-fit test. The results obtained explain not only the reason of a poor repeatability in the efr measurement but also create some hints for improving it. The new method brought down enables compensation for the influence of the inherent bias on the efr accuracy. The idea is accomplished by substituting (to the efr definition) the correct standard deviation as depending on the amplitude V and DC bias C of a pure sine wave stimulus.
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页码：1148 / 1151
页数：4
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