Second-harmonic imaging of poled silica waveguides

被引:16
作者
Arentoft, J
Pedersen, K
Bozhevolnyi, SI
Kristensen, M
Yu, P
Nielsen, CB
机构
[1] Res Ctr COM, DK-2800 Lyngby, Denmark
[2] Univ Aalborg, Inst Phys, DK-9220 Aalborg, Denmark
[3] Mikroelekt Ctr, DK-2800 Lyngby, Denmark
关键词
D O I
10.1063/1.125644
中图分类号
O59 [应用物理学];
学科分类号
摘要
Electric-field poled silica-based waveguides are characterized by measurements of second-harmonic generation (SHG) and of the linear electro-optic effect (LEO). A SHG scanning technique allowing for high-resolution imaging of poled devices is demonstrated. Scans along the direction of the poling field show that the second-order optical nonlinearity is located near the interface between differently doped glass layers. Both SHG and LEO measurements indicate that the ratio between the main elements of the second-order nonlinear optical susceptibility tensor, chi(33)((2)) and chi(31)((2)), is significantly smaller than three. (C) 2000 American Institute of Physics. [S0003-6951(00)03301-5].
引用
收藏
页码:25 / 27
页数:3
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