Nonlinear optical properties of hydrogenated amorphous Si films probed by a novel Z-scan technique

被引:7
作者
Minamikawa, Naoki [1 ]
Tanaka, Keiji [1 ]
机构
[1] Hokkaido Univ, Grad Sch Engn, Dept Appl Phys, Kita Ku, Sapporo, Hokkaido 0608628, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2006年 / 45卷 / 33-36期
关键词
amorphous Si; nonlinear optics; Z-scan; optical device;
D O I
10.1143/JJAP.45.L960
中图分类号
O59 [应用物理学];
学科分类号
摘要
Two-photon absorption coefficient beta and intensity-dependent refractive-index n(2) at a wavelength of 1.06 mu m in hydrogenated amorphous Si films have been evaluated using an imaging-type Z-scan technique. Obtained beta and n(2) are 3000cm/GW and 0.006 cm(2)/GW, which are compared with others and discussed in light of a relation proposed by Sheik-Bahae et al. for crystalline semiconductors. Potential of the film to optical communication devices is pointed out.
引用
收藏
页码:L960 / L962
页数:3
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